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Proceedings Paper

Experimental Image Alignment System
Author(s): Alan L. Moyer; Stephen T. Kowel; Phillip G. Kornreich
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Paper Abstract

A microcomputer-based instrument forlimage alignment with respect to a reference image is described which uses the DEFT sensor (Direct Electronic Fourier Transform) for image sensing and preprocessing. The instrument alignment algorithm which uses the two-dimensional Fourier transform as input is also described. It generates signals used to steer the stage carrying the test image into the correct orientation. This algorithm has computational advantages over algorithms which use image intensity data as input and is suitable for a microcomputer-based instrument since the two-dimensional Fourier transform is provided by the DEFT sensor.

Paper Details

Date Published: 8 August 1980
PDF: 6 pages
Proc. SPIE 0230, Minicomputers and Microprocessors in Optical Systems, (8 August 1980); doi: 10.1117/12.958815
Show Author Affiliations
Alan L. Moyer, Deft Laboratories, Inc (United States)
Stephen T. Kowel, Syracuse University (United States)
Phillip G. Kornreich, Syracuse University (United States)


Published in SPIE Proceedings Vol. 0230:
Minicomputers and Microprocessors in Optical Systems
Chris L. Koliopoulos; Frederic M. Zweibaum, Editor(s)

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