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Proceedings Paper

Microprocessor-Controlled Photodetector Test Console
Author(s): Eustace L. Dereniak; Earl M. Hicks; John J. Speer; Arthur M. McDevitt
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Paper Abstract

The integration of a microprocessor into a detector test console is described. Responsivity and D* measurements are performed as a function of frequency, detector bias voltage, and detector temperature. The system has been designed for use with a photoconductor test console; however, minor modifications will allow it to be used for evaluation of other detector types. Detector tests for a single photoconductor element usually require about 250 data points to fully characterize its optimum operating temperature, bias, and frequency response. The increasing importance of high density detector focal plane arrays with 100 elements or more has stimulated interest in microprocessor control to reduce operator fatigue and other human engineering problems. Therefore, a data collection and analysis scheme using a microprocessor can give test results that are not only more accurate but much less expensive. This system costs about $2500 to integrate into an appropriate existing detector test console.

Paper Details

Date Published: 8 August 1980
PDF: 17 pages
Proc. SPIE 0230, Minicomputers and Microprocessors in Optical Systems, (8 August 1980); doi: 10.1117/12.958814
Show Author Affiliations
Eustace L. Dereniak, University of Arizona (United States)
Earl M. Hicks, University of Arizona (United States)
John J. Speer, University of Arizona (United States)
Arthur M. McDevitt, University of Arizona (United States)


Published in SPIE Proceedings Vol. 0230:
Minicomputers and Microprocessors in Optical Systems
Chris L. Koliopoulos; Frederic M. Zweibaum, Editor(s)

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