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Proceedings Paper

Focal Plane Testing From A Production Point Of View: A Tutorial
Author(s): D. F. Schmunk; A. H. Marshall; R. J. Sonners
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Paper Abstract

Focal plane production testing to be cost and schedule effective involves many tradeoffs which appear very difficult to optimize. This optimization appears particularly difficult for the more sophisticated devices which have detailed and interactive specifications. These tradeoffs will be broken down into major categories with clear optimization procedures and guidelines provided so that their individual impacts will be more easily understood. Production yields of focal planes can be significantly increased and costs reduced - the technology and techniques are at hand. The manufacturers ability can be further optimized through wise, concise testing at cryogenic temperatures which has long been an industry bottleneck. The six major categories to be discussed are: 1) Go/No Go Testing; 2) Characterization; 3) Specification vs Performance and Cost Tradeoffs; 4) Earliest Significant Testing; 5) Room and Cryogenic Temperature Testing and 6) Self and Diagnostic Testing. Practical examples will be shown to demonstrate the basic techniques so that a firm foundation of each of the major categories will be obtained.

Paper Details

Date Published: 6 August 1980
PDF: 7 pages
Proc. SPIE 0225, Infrared Image Sensor Technology, (6 August 1980); doi: 10.1117/12.958709
Show Author Affiliations
D. F. Schmunk, Rockwell International (United States)
A. H. Marshall, Rockwell International (United States)
R. J. Sonners, Rockwell International (United States)

Published in SPIE Proceedings Vol. 0225:
Infrared Image Sensor Technology
Esther Krikorian, Editor(s)

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