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Proceedings Paper

Inferential Physical Measurements Using Detectors And Detector Arrays
Author(s): Fred Abbott; K. K. Burhardt; F. M. Waltz
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Paper Abstract

Some uses of photodiode detector arrays for on-line inferential measurement of process parameters are described in this paper. Optical considerations involving these arrays are discussed. High resolution camera lenses are not necessarily best in these applications since different lens design considerations apply when discrete arrays are used. Serious linearity and repeatability problems that were encountered with some commercially available solid state camera systems are discussed. The requirement of modest system cost, coupled with the need for high speed on line analysis, place stringent restrictions on the type and amount of computer analysis that can be carried out. A set of recognition algorithms which have worked well in the initial applications are described. Some of the remaining problems, and possible approaches to them, are presented.

Paper Details

Date Published: 28 May 1980
PDF: 8 pages
Proc. SPIE 0220, Optics in Metrology and Quality Assurance, (28 May 1980); doi: 10.1117/12.958578
Show Author Affiliations
Fred Abbott, Engineering Systems and Technology Laboratory (United States)
K. K. Burhardt, Engineering Systems and Technology Laboratory (United States)
F. M. Waltz, Engineering Systems and Technology Laboratory (United States)

Published in SPIE Proceedings Vol. 0220:
Optics in Metrology and Quality Assurance
Harvey L. Kasdan, Editor(s)

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