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Proceedings Paper

Use Of Pockers Readout Optical Modulators (PROMS) For Atomic Resolution Electron Image Processing
Author(s): J.C. H. Spence; A . Olsen
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Paper Abstract

The usefulness of PROMS for high resolution electron microscopy is outlined. A theoretical model for direct electron beam image storage in PROMS is given, and computed results discussed. Wear-atomic resolution electron images of the Bi12Si020 crystal structure are shown and discussed.

Paper Details

Date Published: 25 April 1980
PDF: 7 pages
Proc. SPIE 0218, Devices and Systems for Optical Signal Processing, (25 April 1980); doi: 10.1117/12.958520
Show Author Affiliations
J.C. H. Spence, Arizona State University (United States)
A . Olsen, Arizona State University (United States)

Published in SPIE Proceedings Vol. 0218:
Devices and Systems for Optical Signal Processing
Timothy C. Strand; Armand R. Tanguay, Editor(s)

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