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Proceedings Paper

Extrinsic Charge-Extraction Device (XCED)--An Extrinsic-Silicon Focal-Plane Array Architecture
Author(s): David N. Pocock; Kuang Y. Chiu; Rolland A. Missman; David E. Nuttall
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Paper Abstract

The XCED (extrinsic charge-extraction device) is a unique focal-plane array structure designed for staring infrared-imaging applications. Extrinsic-silicon detectors, MOS integrating storage capacitors, and unique accumulation mode multiplexing devices are combined in a two-dimensional array within a single monolithic chip. Zinc-doped silicon has been studied and utilized to fabricate detectors sensitive in the 2 to 4 Ilm spectral band with BLIP operating temperatures above 110°K. The potentially severe problems for staring arrays of element-to-element nonuniformities and detector storage saturation have been solved. Preliminary results and thermal imagery are shown for a 16 x 16 element array.

Paper Details

Date Published: 7 May 1980
PDF: 10 pages
Proc. SPIE 0217, Advances in Focal Plane Technology, (7 May 1980); doi: 10.1117/12.958474
Show Author Affiliations
David N. Pocock, Northrop Research & Technology Center (United States)
Kuang Y. Chiu, Northrop Research & Technology Center (United States)
Rolland A. Missman, Northrop Research & Technology Center (United States)
David E. Nuttall, Northrop Research & Technology Center (United States)

Published in SPIE Proceedings Vol. 0217:
Advances in Focal Plane Technology
William S. Chan, Editor(s)

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