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Proceedings Paper

Advances and Applications of Electronic Speckle Pattern Interferometry (ESPI)
Author(s): Ole J. Lokberg
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Paper Abstract

The principle of Electronic Speckle Pattern Interferometry - ESPI - is explained by comparing it to image holography where recording and reconstruction are performed by videotechniques. As such, ESPI can be used for different interferometric measurements, but it is especially suitable for vibration testing and measurement of movements. Our work on extending the measuring range and general use of ESPI for those purposes is described and illustrated by some practical applications.

Paper Details

Date Published: 14 May 1980
PDF: 6 pages
Proc. SPIE 0215, Recent Advances in Holography, (14 May 1980); doi: 10.1117/12.958425
Show Author Affiliations
Ole J. Lokberg, University of Arizona (United States)


Published in SPIE Proceedings Vol. 0215:
Recent Advances in Holography
Poohsan N. Tamura; Tzuo-Chang Lee, Editor(s)

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