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Proceedings Paper

Subpicosecond Dye Laser Pulses: A New Tool For Optical Metrology
Author(s): J -C. Diets; J. J. Fontaine
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Paper Abstract

A new passively mode locked laser source developed at the Center for Laser Studies yielded pulses shorter than 0.14 ps, at a rate of 250 MHz or 0.3 ps pulses at a rate of 500 MHz. The laser and its modes of operation are described. With this source and a second order cross correlation technique similar to the autocorrelation used to determine the pulse duration, time domain reflectometry measurements can be made with a resolution of 40 µm. Three dimensional images can be made by time resolving the backscattered radiation of a beam scanned through a medium. The depth resolution of 0.1 µm can be carried over to the other two dimensions by computer reconstruction. The new technique should have important applications in medicine and biology. Because of the short duration of the laser pulses, high peak intensities can be used without damage to the tissues. Therefore, light measurements can be conducted through a larger depth than with continuous radiation.

Paper Details

Date Published: 20 May 1980
PDF: 7 pages
Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, (20 May 1980); doi: 10.1117/12.958317
Show Author Affiliations
J -C. Diets, University of Southern California (United States)
J. J. Fontaine, Universite Louis Pasteur (France)

Published in SPIE Proceedings Vol. 0210:
2nd European Congress on Optics Applied to Metrology
Michel H. Grosmann; Patrick Meyrueis, Editor(s)

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