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Proceedings Paper

Investigation of thermomechanical effects of lighting conditions on canvas paintings by laser shearography
Author(s): M. K. Meybodi; I. Dobrev; P. Klausmeyer; E. J. Harrington; C. Furlong
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Paper Abstract

Quantitative techniques to characterize thermomechanical effects of light on canvas paintings are necessary in order to better understand the deleterious effects that light has on precious art collections in museum exhibitions. In this paper, we present advances in the development of a customized laser shearography system for temporal characterization of inplane displacements of canvas paintings when subjected to specific lighting conditions. The shearography system is synchronized with a thermal IR camera and concomitant measurements of derivatives of displacements along two orthogonal shearing directions as well as thermal fields are performed. Due to the nature of the measurements, we have developed real-time temporal phase unwrapping algorithms and high-resolution Fast Fourier Transform (FFT) methods to calibrate applied shearing levels. In addition, we are developing methods to isolate thermally-induced components from randomly-induced mechanical vibrations that occur in museum environments by application of IR imaging data. Representative examples are shown, which illustrate capabilities to measure, detect, and map crack propagation as a function of lighting conditions and time.

Paper Details

Date Published: 13 September 2012
PDF: 8 pages
Proc. SPIE 8494, Interferometry XVI: Applications, 84940A (13 September 2012); doi: 10.1117/12.958089
Show Author Affiliations
M. K. Meybodi, Worcester Polytechnic Institute (United States)
I. Dobrev, Worcester Polytechnic Institute (United States)
P. Klausmeyer, Worcester Art Museum (United States)
E. J. Harrington, Worcester Polytechnic Institute (United States)
C. Furlong, Worcester Polytechnic Institute (United States)


Published in SPIE Proceedings Vol. 8494:
Interferometry XVI: Applications
Cosme Furlong; Christophe Gorecki; Erik L. Novak, Editor(s)

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