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Proceedings Paper

Cavity Radiometer Reflectance
Author(s): E. F. Zalewski; J. Geist; R. C. Willson
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Paper Abstract

The evolution of absorbing surfaces for electrically calibrated radiometers, and techniques for measuring their absorptance (reflectance) are described. A new reflectometer for cavity reflectance measurements, which is based on a ring-shaped silicon photodiode, is described. The results of reflectance measurements on a series of cavities which represent the evolution of cavity technology are presented, and the significance of the results for future research are discussed.

Paper Details

Date Published: 15 November 1979
PDF: 7 pages
Proc. SPIE 0196, Measurements of Optical Radiations, (15 November 1979); doi: 10.1117/12.957968
Show Author Affiliations
E. F. Zalewski, National Bureau of Standards (United States)
J. Geist, National Bureau of Standards (United States)
R. C. Willson, Jet Propulsion Laboratory (United States)


Published in SPIE Proceedings Vol. 0196:
Measurements of Optical Radiations
Harold P. Field; Edward F. Zalewski; Frederic M. Zweibaum, Editor(s)

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