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Proceedings Paper

Laser Spatial Profile Measurement Device
Author(s): William R. Mallory; Francis X. Jeskie; W. Lee Blanton
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Paper Abstract

A device is described which measures the spatial profile of a laser in either the near field or far field. The laser pattern is imaged onto a pyroelectric vidicon (PEV) camera. A single frame is extracted from the camera and the image is processed using a PDP 11/20 to correct for PEV imperfections. The device will measure lasers having wavelengths of 2 µm to 10.6 µm. Detailed characteristics of the device are given.

Paper Details

Date Published: 15 November 1979
PDF: 5 pages
Proc. SPIE 0196, Measurements of Optical Radiations, (15 November 1979); doi: 10.1117/12.957965
Show Author Affiliations
William R. Mallory, Systems Research Laboratories, Inc. (United States)
Francis X. Jeskie, Systems Research Laboratories, Inc. (United States)
W. Lee Blanton, Systems Research Laboratories, Inc. (United States)


Published in SPIE Proceedings Vol. 0196:
Measurements of Optical Radiations
Harold P. Field; Edward F. Zalewski; Frederic M. Zweibaum, Editor(s)

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