Share Email Print
cover

Proceedings Paper

On The Possibility Of An Absolute Radiometric Standard Based On The Quantum Efficiency Of A Silicon Photodiode
Author(s): Jon Geist
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The physical mechanisms governing the behavior of silicon photovoltaic p-n junctions are reviewed from the point of view of using the internal quantum efficiency of such devices as absolute radiometric standards.

Paper Details

Date Published: 15 November 1979
PDF: 9 pages
Proc. SPIE 0196, Measurements of Optical Radiations, (15 November 1979); doi: 10.1117/12.957958
Show Author Affiliations
Jon Geist, National Bureau of Standards (United States)


Published in SPIE Proceedings Vol. 0196:
Measurements of Optical Radiations
Harold P. Field; Edward F. Zalewski; Frederic M. Zweibaum, Editor(s)

© SPIE. Terms of Use
Back to Top