Share Email Print

Proceedings Paper

On The Possibility Of An Absolute Radiometric Standard Based On The Quantum Efficiency Of A Silicon Photodiode
Author(s): Jon Geist
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The physical mechanisms governing the behavior of silicon photovoltaic p-n junctions are reviewed from the point of view of using the internal quantum efficiency of such devices as absolute radiometric standards.

Paper Details

Date Published: 15 November 1979
PDF: 9 pages
Proc. SPIE 0196, Measurements of Optical Radiations, (15 November 1979); doi: 10.1117/12.957958
Show Author Affiliations
Jon Geist, National Bureau of Standards (United States)

Published in SPIE Proceedings Vol. 0196:
Measurements of Optical Radiations
Harold P. Field; Edward F. Zalewski; Frederic M. Zweibaum, Editor(s)

© SPIE. Terms of Use
Back to Top