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Proceedings Paper

Double Michelson Interferometer For Contactless Thermal Expansion Measurements
Author(s): E. G. Wolff; S. A. Eselun
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Paper Abstract

Laser interferometry provides adequate range and resolution for thermal expansion measurements. However, accuracy can be achieved only if the relative motions of the sample and the optics are known and/ or accounted for. The system described incorporates self compensating features into the optics. Signal processing techniques for real time length change recording are also discussed.

Paper Details

Date Published: 25 December 1979
PDF: 5 pages
Proc. SPIE 0192, Interferometry, (25 December 1979); doi: 10.1117/12.957858
Show Author Affiliations
E. G. Wolff, The Aerospace Corporation (United States)
S. A. Eselun, The Aerospace Corporation (United States)

Published in SPIE Proceedings Vol. 0192:
George W. Hopkins, Editor(s)

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