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Proceedings Paper

Infrared Laser Interferometer
Author(s): Peter L. Domenicali
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Paper Abstract

An infrared laser interferometer operating at 1.06 micrometers is fully described. Starting with a discussion of the applications of infrared interferometery, this paper examines the features of the interferometer and explains its operation. The effect of laser coherence length on obtaining high-quality fringe patterns is explored. Various techniques for setting up test configurations and aligning the system using the infrared radiation are described. The system has fringe photography capability and is fully interfaceable with existing microporcessor-based data reduction systems. The emphasis is on the practicality and usability of this infrared laser interferometer.

Paper Details

Date Published: 25 December 1979
PDF: 7 pages
Proc. SPIE 0192, Interferometry, (25 December 1979); doi: 10.1117/12.957830
Show Author Affiliations
Peter L. Domenicali, Zygo Corporation (United States)

Published in SPIE Proceedings Vol. 0192:
George W. Hopkins, Editor(s)

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