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Proceedings Paper

Flash X-Ray Diffraction Study During Shock-Compression
Author(s): K. Kondo; A. Sawaoka; S. Saito
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Paper Abstract

Flash X-ray diffraction (FXD) study was performed during shock-compression by using the Blumlein FX source and an image intensifier. The dimension of this Blumlein body is approximately 6 m in length and 0.2 m in diameter. The electric pulse is 80 nsec wide but the real X-ray pulse is estimated to have a width of a few 10 nsec. The optimum condition of electrode dimensions for X-ray radiation was determined. The delay and jitter to trigger the FX source were also determined to synchronize the X-ray pulse pre-cisely with the arrival of the shock front. FXD patterns of LiF during shock-compression have been obtained up to 50 GPa.

Paper Details

Date Published: 27 July 1979
PDF: 4 pages
Proc. SPIE 0189, 13th Intl Congress on High Speed Photography and Photonics, (27 July 1979); doi: 10.1117/12.957594
Show Author Affiliations
K. Kondo, Tokyo Institute of Technology (Japan)
A. Sawaoka, Tokyo Institute of Technology (Japan)
S. Saito, Tokyo Institute of Technology (Japan)

Published in SPIE Proceedings Vol. 0189:
13th Intl Congress on High Speed Photography and Photonics
Shin-Ichi Hyodo, Editor(s)

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