Share Email Print

Proceedings Paper

Moire Topography As Applied To High Speed Deformation
Author(s): Takao Tsuno; Yoshio Nakamura
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This study aimed to measure high speed deformation with maximum time resolution in the range of a few microseconds. The accuracy of deformation measurement by means of Moire topography of projection type was examined on the basis of geometrical optics. As a rerult of varying the various parameters, the error was reduced by increasing the magnification and the focal length of a projection lens. Exam-ples of real-time and time-resolved Moire topography as applied for the deformation of a thin glass sheet taken by means of a high speed streak camera were presented.

Paper Details

Date Published: 27 July 1979
PDF: 4 pages
Proc. SPIE 0189, 13th Intl Congress on High Speed Photography and Photonics, (27 July 1979); doi: 10.1117/12.957564
Show Author Affiliations
Takao Tsuno, University of Tokyo (Japan)
Yoshio Nakamura, University of Tokyo (Japan)

Published in SPIE Proceedings Vol. 0189:
13th Intl Congress on High Speed Photography and Photonics
Shin-Ichi Hyodo, Editor(s)

© SPIE. Terms of Use
Back to Top