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Proceedings Paper

Moire Topography As Applied To High Speed Deformation
Author(s): Takao Tsuno; Yoshio Nakamura
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Paper Abstract

This study aimed to measure high speed deformation with maximum time resolution in the range of a few microseconds. The accuracy of deformation measurement by means of Moire topography of projection type was examined on the basis of geometrical optics. As a rerult of varying the various parameters, the error was reduced by increasing the magnification and the focal length of a projection lens. Exam-ples of real-time and time-resolved Moire topography as applied for the deformation of a thin glass sheet taken by means of a high speed streak camera were presented.

Paper Details

Date Published: 27 July 1979
PDF: 4 pages
Proc. SPIE 0189, 13th Intl Congress on High Speed Photography and Photonics, (27 July 1979); doi: 10.1117/12.957564
Show Author Affiliations
Takao Tsuno, University of Tokyo (Japan)
Yoshio Nakamura, University of Tokyo (Japan)

Published in SPIE Proceedings Vol. 0189:
13th Intl Congress on High Speed Photography and Photonics
Shin-Ichi Hyodo, Editor(s)

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