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Proceedings Paper

Scene Matching With Feature Detection
Author(s): J. F. Belsher; H. F. Williams; R. H. Kin
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Paper Abstract

The Rockwell Pattern Matcher (RPM) is a feature based image matcher which has been demonstrated on passive IR and active laser images. Edge features are extracted and used to match electro-optical images. Matches have been made to reference images at the same wavelength as well as with reference imagery at the optical wavelength. In addition, a technique using three dimensional edge references has been utilized to automatically compensate the effects of geometric distortions due to different perspectives. Recent advances in computing technology make it passible to perform the required digital processing for a variety of applications.

Paper Details

Date Published: 4 September 1979
PDF: 9 pages
Proc. SPIE 0186, Digital Processing of Aerial Images, (4 September 1979); doi: 10.1117/12.957494
Show Author Affiliations
J. F. Belsher, Rockwell International Corporation (United States)
H. F. Williams, Rockwell International Corporation (United States)
R. H. Kin, Rockwell International Corporation (United States)


Published in SPIE Proceedings Vol. 0186:
Digital Processing of Aerial Images
Ernest L. Hall; Thomas F. Wiener, Editor(s)

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