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Proceedings Paper

New Approach To Automated Optical/Digital Pattern Recognition
Author(s): R. D. Leighty; G. E. Lukes
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Paper Abstract

Optical power spectral (OPS) analysis has demonstrated significant advantages for rapidly classifying simple patterns from aerial transparencies. However, as the pattern sets become larger and more complicated, the required software is more complex, the equipment requirements more demanding, and the processing time increases. Additionally, potential ambiguity of the OPS data due to loss of phase information places some unknown upper limit on the information content in OPS. Integration of other pattern recognition data which supplements the OPS analysis leads to an increased pattern classification potential. The optical/ digital system discussed integrates a photo diode array detector in the image domain with the OPS system. Hierarchical strategies employ initial OPS sampling and preliminary classification of patterns of potential interest. Space domain sampling and classification is only initiated when cued from the OPS samples. This system leads to a wide range of exper-imental capabilities and operational potentials. The paper discusses system configuration, experimental results, and future plans.

Paper Details

Date Published: 10 August 1979
PDF: 10 pages
Proc. SPIE 0185, Optical Processing Systems, (10 August 1979); doi: 10.1117/12.957484
Show Author Affiliations
R. D. Leighty, U. S. Army Engineer Topographic Laboratories (United States)
G. E. Lukes, U. S. Army Engineer Topographic Laboratories (United States)

Published in SPIE Proceedings Vol. 0185:
Optical Processing Systems
William T. Rhodes, Editor(s)

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