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Proceedings Paper

Effects Of Scattering On X-Ray Imaging
Author(s): Robert J. Noll
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Paper Abstract

Very high spatial frequency irregularities with small amplitude on a polished surface that usually cause wide-angle scattering in conventional optical systems produce narrow-angle scattering in X-ray systems. Yet, even this small amount of scattering degrades the imaging properties of X-ray systems. Statistical surface perturbations and their effects on X-ray image quality are discussed. A model of surface roughness that is reasonably consistent with surface-profile measurements and visible-scatter-profile measurement is discussed. This model is then used to evaluate the image profile of an X-ray system.

Paper Details

Date Published: 9 August 1979
PDF: 8 pages
Proc. SPIE 0184, Space Optics Imaging X-Ray Optics Workshop, (9 August 1979); doi: 10.1117/12.957452
Show Author Affiliations
Robert J. Noll, Perkin-Elmer Corporation (United States)


Published in SPIE Proceedings Vol. 0184:
Space Optics Imaging X-Ray Optics Workshop
Martin C. Weisskopf, Editor(s)

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