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Proceedings Paper

Techniques For Evaluating The Surface Finish Of X-Ray Optics
Author(s): H. E. Bennett
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Paper Abstract

Arguments leading to the tentative conclusion that production and measurement techniques developed for low scatter optical surfaces should be directly applicable to low scatter x-ray optics are briefly reviewed, and some of the more useful methods for making and testing high quality optical surfaces are discussed.

Paper Details

Date Published: 9 August 1979
PDF: 14 pages
Proc. SPIE 0184, Space Optics Imaging X-Ray Optics Workshop, (9 August 1979); doi: 10.1117/12.957445
Show Author Affiliations
H. E. Bennett, Naval Weapons Center (United States)

Published in SPIE Proceedings Vol. 0184:
Space Optics Imaging X-Ray Optics Workshop
Martin C. Weisskopf, Editor(s)

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