Share Email Print
cover

Proceedings Paper

Techniques For Evaluating The Surface Finish Of X-Ray Optics
Author(s): H. E. Bennett
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Arguments leading to the tentative conclusion that production and measurement techniques developed for low scatter optical surfaces should be directly applicable to low scatter x-ray optics are briefly reviewed, and some of the more useful methods for making and testing high quality optical surfaces are discussed.

Paper Details

Date Published: 9 August 1979
PDF: 14 pages
Proc. SPIE 0184, Space Optics Imaging X-Ray Optics Workshop, (9 August 1979); doi: 10.1117/12.957445
Show Author Affiliations
H. E. Bennett, Naval Weapons Center (United States)


Published in SPIE Proceedings Vol. 0184:
Space Optics Imaging X-Ray Optics Workshop
Martin C. Weisskopf, Editor(s)

© SPIE. Terms of Use
Back to Top