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Proceedings Paper

Optical Coating Techniques For Wolter-Type Substrates
Author(s): D. P. Mathur; Daniel R. Adamo; Roy C. Bastien; Edward A. Strouse
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Paper Abstract

Analysis of the Wolter type substrates in terms of optical coating parameters is discussed. This analysis shows that, in general, the variations in coating thickness can be reduced to negligible proportions by properly using aperture masks and by rotating and translating Wolter type substrates. Results achieved in coating the optical elements of the HEAO-2 X-ray telescope are discussed in view of the analysis.

Paper Details

Date Published: 9 August 1979
PDF: 9 pages
Proc. SPIE 0184, Space Optics Imaging X-Ray Optics Workshop, (9 August 1979); doi: 10.1117/12.957443
Show Author Affiliations
D. P. Mathur, Perkin-Elmer Corporation (United States)
Daniel R. Adamo, Perkin-Elmer Corporation (United States)
Roy C. Bastien, Perkin-Elmer Corporation (United States)
Edward A. Strouse, Perkin-Elmer Corporation (United States)

Published in SPIE Proceedings Vol. 0184:
Space Optics Imaging X-Ray Optics Workshop
Martin C. Weisskopf, Editor(s)

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