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Proceedings Paper

Proposed Specification For Measuring Optical Scatter
Author(s): Vernon L. Williams
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Paper Abstract

At the present time there is no specification that is generally accepted by the optical community which can be used to specify optical scatter. In this paper the general content of such a specification is proposed. A first step is the choice of a suitable calibration standard for scatter. It is proposed that a calibrated set of SiC mirrors be used for this purpose because these mirrors are hard, durable and can be fabricated with a surface microirregularity down to 10Å rms. Two methods are proposed for measuring optical scatter: 1) Total Integrated Scatter (TIS); and 2) Bidirectional Reflection-Distribution Function (BRDF). It is important to consider both methods. TIS is simple to measure and can be used to calculate surface microirregularity. On the other hand BRDF gives scatter a function of evident angle. The major points of the proposed scatter specification are outlined, taking into account that scatter can be defined either by TIS or BRDF.

Paper Details

Date Published: 7 September 1979
PDF: 5 pages
Proc. SPIE 0181, Contemporary Optical Systems and Components Specifications, (7 September 1979); doi: 10.1117/12.957355
Show Author Affiliations
Vernon L. Williams, Westinghouse Electric Corporation (United States)

Published in SPIE Proceedings Vol. 0181:
Contemporary Optical Systems and Components Specifications
Robert E. Fischer, Editor(s)

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