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Proceedings Paper

Determination Of High-Intensity X-Ray Spectra
Author(s): James A. Mulvaney; Raymond P. Rossi
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Paper Abstract

A method for determining high intensity x-ray spectra from diagnostic x-ray units is described. The method combines direct measurements of low intensity, constant potential x-ray spectra with digitized measurements of current and voltage waveforms at high intensity to determine high intensity x-ray spectra. The effect of ripple in the voltage waveform on the resulting x-ray spectra is also shown.

Paper Details

Date Published: 6 July 1979
PDF: 6 pages
Proc. SPIE 0173, Application of Optical Instrumentation in Medicine VII, (6 July 1979); doi: 10.1117/12.957116
Show Author Affiliations
James A. Mulvaney, University of Colorado Medical Center (United States)
Raymond P. Rossi, University of Colorado Medical Center (United States)


Published in SPIE Proceedings Vol. 0173:
Application of Optical Instrumentation in Medicine VII
Joel E. Gray, Editor(s)

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