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Proceedings Paper

A High Accuracy Surface Contour Measuring Machine
Author(s): Daniel Bajuk
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Paper Abstract

A surface contour measuring machine is described which can measure general aspheric or axi-symmetric aspheric surfaces repeatably to .000005 inches or better in most cases. The computer system which controls the measuring machine and which performs the data analysis is discussed. Aspheric production applications are shown in which the measuring machine plays a vital role.

Paper Details

Date Published: 4 April 1979
PDF: 11 pages
Proc. SPIE 0171, Optical Components: Manufacture and Evaluation, (4 April 1979); doi: 10.1117/12.957049
Show Author Affiliations
Daniel Bajuk, Tinsley Laboratories, Inc. (United States)


Published in SPIE Proceedings Vol. 0171:
Optical Components: Manufacture and Evaluation
Donald S. Nicholson, Editor(s)

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