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Proceedings Paper

Automatic Optical Measurement Systems
Author(s): M.Thomas Jackson
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Paper Abstract

Programmable electro-optical measuring systems are being readily introduced to industrial inspection applications. Major improvements in the operation, measuring power and speed of the devices have served as impetus to the increase in their popularity and acceptance. The majority of system improvements have come on the wings of technological advances in individual component members; microcircuitry has dimished the size and price of components yet increased their performance and reliability. Presently solid state scanners employ dense CID matrix arrays to reduce or eliminate many of the problems associated with CCD arrays or imaging tubes. The CID lacks the resolution of either vidicon or image dissector sensors, however, measuring accuracies achieved using tube devices can be approached by the lower resolution CID through proper application of quality optics. Inexpensive floppy disk storage has further enhanced the usefulness of the newer machines by providing capacity for unlimited programs and data storage.

Paper Details

Date Published: 8 May 1971
PDF: 2 pages
Proc. SPIE 0170, Optics in Quality Assurance II, (8 May 1971); doi: 10.1117/12.957027
Show Author Affiliations
M.Thomas Jackson, EMR Photoelectric (United States)


Published in SPIE Proceedings Vol. 0170:
Optics in Quality Assurance II
Harvey L. Kasdan, Editor(s)

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