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Proceedings Paper

Interfacing Photodiode Array Cameras To Microcomputers For Quality Control
Author(s): Dan Pichulo
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Paper Abstract

Optical sensors are rinding increased usage in inspection and quality assurance applications. The versatility and high speed data gathering capabilities of imaging sensors lend themselves to complex applications such as pattern recognition and gray-scale defect deter-minations. Applications of this type usually require computer capability to mandLutte and digest the data but optical scanning rates usually outpace the instruction cycle rates of microcomputers. This paper discusses a method of handling high speed imaging data to pro vide real time computer analysis, decision and control. Methods and technical designs are described that provide data compression, formatting and preprocessing. Hanipulative tech.- niques for both digital and analog (video) signals are discussed.

Paper Details

Date Published: 8 May 1971
PDF: 7 pages
Proc. SPIE 0170, Optics in Quality Assurance II, (8 May 1971); doi: 10.1117/12.957024
Show Author Affiliations
Dan Pichulo, EG&G Reticon (United States)


Published in SPIE Proceedings Vol. 0170:
Optics in Quality Assurance II
Harvey L. Kasdan, Editor(s)

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