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Proceedings Paper

New Approach To Precision Automatic Refractometry
Author(s): R. M. Lee
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Paper Abstract

For routine precision measurements of refractive index, many optical glass manufacturers, such as Chance-Pilkington are presently using the Hilger-Chance Vee block refractometer which was first marketed in 1947. With a need for a higher throughput of glass samples, greater accuracy in measurements and a reduction in operator fatigue, a new automatic instrument based on the same 'vee' block principle has been commissioned by Chance-Pilkingtons. The new instrument is capable of accuracies in refractive index of ± 1 x 10-5 over a range of 1.48 to 1.95 and many of the limitations of the original Hilger-Chance design have been overcome. An interferometric technique is being included to encode the deviation angle for electronic readout. The design of this new system is described and discussed.

Paper Details

Date Published: 25 September 1979
PDF: 5 pages
Proc. SPIE 0163, Advances in Optical Production Technology II, (25 September 1979); doi: 10.1117/12.956907
Show Author Affiliations
R. M. Lee, Imperial College (United Kingdom)

Published in SPIE Proceedings Vol. 0163:
Advances in Optical Production Technology II

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