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Proceedings Paper

Windshield Quality And Pilot Performance Measurement Utilizing Computer-Generated Imagery
Author(s): Conrad L. Kraft; Charles L. Elworth; Charles D. Anderson
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Paper Abstract

Two experimental investigations were performed with C-141 pilots making aircraft landings with a 727-200 flight crew training simulator mounted on a three-degree-of-freedom motion base. The terrain image was computer-generated and the 1000 TV line, full color scene was displayed at optical infinity with a resolution of 2.9 arc minutes. All pilots were extensively tested for visual skills. Optical distortion panels between the pilot and the visual scene simulated a range of windscreen image qualities from excellent to poor. One study used 8 pilots, 4 windscreen qualities, 2 times-of-day and 2 visibility conditions. A second study used 6 pilots, 3 windscreen qualities, 2 times-of-day, and 4 replications. In both studies, ten dependent measures were taken of pilots' perfor-mance. Decreased windscreen optical quality increased centerline deviations at touchdown point Windscreen quality and time-of-day significantly interacted. Night approaches with poor windscreens were significantly above glide slope, but on glide slope with better wind-screens. Approaches were low for all windscreens in daytime landings. Poor optical quality windscreens caused apparently more cautious night landings: higher faster approaches, more rapid descents and touchdowns that were harder and further down the run-way. Recommendations are made for measuring windscreen optical quality effects on flight performance.

Paper Details

Date Published: 22 December 1978
PDF: 13 pages
Proc. SPIE 0162, Visual Simulation and Image Realism I, (22 December 1978); doi: 10.1117/12.956890
Show Author Affiliations
Conrad L. Kraft, Boeing Aerospace Company (United States)
Charles L. Elworth, Boeing Aerospace Company (United States)
Charles D. Anderson, Boeing Aerospace Company (United States)


Published in SPIE Proceedings Vol. 0162:
Visual Simulation and Image Realism I
Leo Beiser, Editor(s)

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