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Proceedings Paper

Specularity Measurements For Solar Materials
Author(s): M. A. Lind; J. S. Hartman; H. L. Hampton
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Paper Abstract

A technique using Fourier transform analysis which is suitable for measuring the specularity of solar glass components in the mrad and sub-mrad is discussed and demonstrated. A brief mathematical background as well as illustrative examples are included. A number of methods for image analysis are discussed with particular emphasis given to electronic integrating detectors. Typical Fourier plane image distributions are given for a few common solar utilization materials and details of the instrument used to produce the images are considered. The limitations and capabilities of various instruments are outlined along with methods for further enhancing the utility and sensitivity of the technique.

Paper Details

Date Published: 17 November 1978
PDF: 8 pages
Proc. SPIE 0161, Optics Applied to Solar Energy IV, (17 November 1978); doi: 10.1117/12.956878
Show Author Affiliations
M. A. Lind, Pacific Northwest Laboratory (United States)
J. S. Hartman, Pacific Northwest Laboratory (United States)
H. L. Hampton, Pacific Northwest Laboratory (United States)

Published in SPIE Proceedings Vol. 0161:
Optics Applied to Solar Energy IV
Keith D. Masterson, Editor(s)

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