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Proceedings Paper

Scanning Electron Microscope Readout Of Photographic Film
Author(s): Mitchell W. Millman
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Paper Abstract

As part of an overall program to develop techniques for the intensification of severely underexposed photographic negatives, a technique involving the use of a scanning electron microscope (SEM) to scan the film and display the electron beam scattering intensity on a CRT was investigated. While the program was curtailed before the technique could be fully evaluated, the ability to enhance underexposed film by the equivalent of 5 stops a factor of 32 was demonstrated. This compares favorably with other techniques being investigated, such as autoradiographic sensitization. The SEM technique has the further advantages of being real-time, maintaining the high resolution of the original negative, and being nondestructive. In addition to the above mentioned application, this technique has promise as a convenient means of scanning photographic images for digitization and signal processing.

Paper Details

Date Published: 7 December 1978
PDF: 4 pages
Proc. SPIE 0149, Digital Image Processing II, (7 December 1978); doi: 10.1117/12.956679
Show Author Affiliations
Mitchell W. Millman, Lockheed Missiles Et Space Company, Inc. (United States)

Published in SPIE Proceedings Vol. 0149:
Digital Image Processing II
Andrew G. Tescher, Editor(s)

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