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Proceedings Paper

Automated Surface Inspection With Solid-State Image Sensors
Author(s): D. J. Purll
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Paper Abstract

The application to automated surface inspection of solid-state imaging devices, such as photodiode arrays and charge coupled devices (CCD), is discussed in relation to the other forms of electro-optical inspection systems, and the advantages and disadvantages highlighted. A specific application is described, in which a camera containing a 512 element photodiode array has been used to inspect the width and surface quality of a narrow metal strip used in the manufacture of submarine cable.

Paper Details

Date Published: 1 January 1978
PDF: 10 pages
Proc. SPIE 0145, Industrial Applications of Solid State Image Scanners, (1 January 1978); doi: 10.1117/12.956591
Show Author Affiliations
D. J. Purll, Sira Institute Ltd (UK)

Published in SPIE Proceedings Vol. 0145:
Industrial Applications of Solid State Image Scanners
David J. Purll, Editor(s)

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