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Proceedings Paper

The Dynamic Sampling Effect With Charge-Coupled Device (CCD) Imagers
Author(s): Andreas Nordbryhn
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Paper Abstract

Using CCD and CID image sensors, the array of detector elements performs a spatial sampling, which sets a maximum limit (Nyquist frequency) on the spatial resolution. In some sensors the MTF is high at and beyond the Nyquist frequency. By moving the sensor relative to the scene it is possible to obtain samples in between the stationary sampling positions. Thereby, the maximum spatial frequency limit is increased. This paper describes measurements with a CCD image sensor using this dynamic sampling effect. Resolution up to 3.5 times the Nyquist limit is shown. A theoretical calculation of expected obtainable MTF's for different sets of parameters is presented. This can be used to select parameters for best possible result when using the dynamic sampling effect.

Paper Details

Date Published: 15 September 1978
PDF: 12 pages
Proc. SPIE 0143, Applications of Electronic Imaging Systems, (15 September 1978); doi: 10.1117/12.956547
Show Author Affiliations
Andreas Nordbryhn, Naval Research Laboratory (United States)

Published in SPIE Proceedings Vol. 0143:
Applications of Electronic Imaging Systems
Richard E. Franseen; Dieter K. Schroder, Editor(s)

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