Share Email Print
cover

Proceedings Paper

A Difference Contour-Mapping System For The Measurement Of Wear In Dental Restorations
Author(s): Frans H. M. Jongsma; Huub L. M. M. Janssen; Paul Lambrechts; Guido Vanherle
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A real-time moire contouring system, which is insensitive to specular reflections, has enlarged depth of field and is used in conjunction with a micropositioning relocation device, has been built for the measurement of wear in dental restorations. Measurements are carried out on accurate polyvinyl siloxane replicas.

Paper Details

Date Published: 7 July 1986
PDF: 7 pages
Proc. SPIE 0602, Biostereometrics '85, (7 July 1986); doi: 10.1117/12.956296
Show Author Affiliations
Frans H. M. Jongsma, University of Limburg (The Netherlands)
Huub L. M. M. Janssen, University of Technology (The Netherlands)
Paul Lambrechts, Catholic University of Leuven (Belgium)
Guido Vanherle, Catholic University of Leuven (Belgium)


Published in SPIE Proceedings Vol. 0602:
Biostereometrics '85
A. M. Coblentz; Robin E. Herron, Editor(s)

© SPIE. Terms of Use
Back to Top