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Proceedings Paper

Computational Methods For Optical Thin Films
Author(s): Gary W. DeBell
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Paper Abstract

This paper reviews the Smith Chart and the characteristic matrix for evaluating the reflectance of optical thin films. The methods are developed from fundamentals and brief examples are given. The use of an HP-67 programmable calculator to make computations based on these methods is also discussed.

Paper Details

Date Published: 26 September 1978
PDF: 14 pages
Proc. SPIE 0140, Optical Coatings: Applications and Utilization II, (26 September 1978); doi: 10.1117/12.956264
Show Author Affiliations
Gary W. DeBell, Spectra-Physics (United States)


Published in SPIE Proceedings Vol. 0140:
Optical Coatings: Applications and Utilization II
Gary W. DeBell; Douglas H. Harrison, Editor(s)

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