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Proceedings Paper

An Automated Gain Measurement System For High-Energy Chemical Lasers
Author(s): W. F. Otto; J. T. Lewis; C. S. Bartolotta; G. Golnik; G. R. Wisner; R. O. Decker
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Paper Abstract

A highly accurate gain diagnostic system has been developed which will reliably measure gain coefficients as a function of spatial position and laser transition for specific application to high energy chemical lasers. The system consists of a state-of-the-art single line, single mode, frequency-stabilized DF/HF chemical laser, an advanced programmable optical system which provides a two dimensional raster scan through the lasing medium, and a mini-computer based data processing and control subsystem. The DF/HF chemical laser and scanning optics have been designed for both remote and local operation. The data processing electronics are capable of providing a "quick look" real time gain profile of the medium. The dedicated mini-computer subsystem has been specifically designed to provide a complete analysis of the gain data in both tabular and graphic forms; and, by storing the data as complete digitized waveforms, dramatically reduces the data analysis time compared to conventional techniques. A detailed discussion of the operation and capabilities of the gain diagnostic system will be presented with representative results of the system.

Paper Details

Date Published: 17 August 1978
PDF: 5 pages
Proc. SPIE 0138, Advances in Laser Technology III: Emphasizing Gaseous Lasers, (17 August 1978); doi: 10.1117/12.956231
Show Author Affiliations
W. F. Otto, Pratt & Whitney Aircraft Group (United States)
J. T. Lewis, Pratt & Whitney Aircraft Group (United States)
C. S. Bartolotta, Pratt & Whitney Aircraft Group (United States)
G. Golnik, Pratt & Whitney Aircraft Group (United States)
G. R. Wisner, United Technologies Research Center (United States)
R. O. Decker, United Technologies Research Center (United States)


Published in SPIE Proceedings Vol. 0138:
Advances in Laser Technology III: Emphasizing Gaseous Lasers
David Finkleman; Joseph Stregack, Editor(s)

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