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Proceedings Paper

Electronic Processing Of Moire Fringes. Application To Moire Topography And Elements Of Comparison With Photogrammetry
Author(s): J. C. Perrin; A. Thomas
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Paper Abstract

Some elements of comparison are given between the projection-type Moire topography and photogrammetry. The basic mathematics of photogrammetry is applied to reconstruct the 3.D. Shape of the object from the Moire pattern. Some particular aspects of the Moire method are discussed and a general methodology is proposed. In connection with this, an opto-electro nic technique is described, which measures the Moire phase with high resolution and sign determination. The experimental results show that this technique is especially suitable for high accuracy automatic reconstruction of 3.D. Shapes.

Paper Details

Date Published: 18 April 1978
PDF: 7 pages
Proc. SPIE 0136, 1st European Conf on Optics Applied to Metrology, (18 April 1978); doi: 10.1117/12.956178
Show Author Affiliations
J. C. Perrin, Centre d'Etudes et de Recherches de la Compagnie Electro-Mecanique (France)
A. Thomas, Centre d'Etudes et de Recherches de la Compagnie Electro-Mecanique (France)


Published in SPIE Proceedings Vol. 0136:
1st European Conf on Optics Applied to Metrology
Michel H. Grosmann; Patrick Meyrueis, Editor(s)

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