Share Email Print
cover

Proceedings Paper

The Diffracting Gauge In Extensometry
Author(s): Jean P. L. Ebbeni
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The principe of the diffracting gauge is based on the farfield diffraction spectrum of a slit. In extensometry this gauge permits to measure easely and cheaply strain components with great sensibility and fidelity in time.

Paper Details

Date Published: 18 April 1978
PDF: 7 pages
Proc. SPIE 0136, 1st European Conf on Optics Applied to Metrology, (18 April 1978); doi: 10.1117/12.956168
Show Author Affiliations
Jean P. L. Ebbeni, Universite Libre de Bruxelles (Belgium)


Published in SPIE Proceedings Vol. 0136:
1st European Conf on Optics Applied to Metrology
Michel H. Grosmann; Patrick Meyrueis, Editor(s)

© SPIE. Terms of Use
Back to Top