Share Email Print
cover

Proceedings Paper

The Diffracting Gauge In Extensometry
Author(s): Jean P. L. Ebbeni
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The principe of the diffracting gauge is based on the farfield diffraction spectrum of a slit. In extensometry this gauge permits to measure easely and cheaply strain components with great sensibility and fidelity in time.

Paper Details

Date Published: 18 April 1978
PDF: 7 pages
Proc. SPIE 0136, 1st European Conf on Optics Applied to Metrology, (18 April 1978); doi: 10.1117/12.956168
Show Author Affiliations
Jean P. L. Ebbeni, Universite Libre de Bruxelles (Belgium)


Published in SPIE Proceedings Vol. 0136:
1st European Conf on Optics Applied to Metrology
Michel H. Grosmann; Patrick Meyrueis, Editor(s)

© SPIE. Terms of Use
Back to Top