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Proceedings Paper

Holographic Testing Of Aspherical Surfaces
Author(s): R. Mercier
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Paper Abstract

The use of a hologram in an interferometer in order to test an aspherical surface poses the problem of the choice between holograms with the carrier on the axis and holograms with inclined carrier. We compare the performances which we can expect from these two types of holograms in the case of an aspherical deformation of the 4th degree.

Paper Details

Date Published: 18 April 1978
PDF: 7 pages
Proc. SPIE 0136, 1st European Conf on Optics Applied to Metrology, (18 April 1978); doi: 10.1117/12.956160
Show Author Affiliations
R. Mercier, University of Paris (France)


Published in SPIE Proceedings Vol. 0136:
1st European Conf on Optics Applied to Metrology
Michel H. Grosmann; Patrick Meyrueis, Editor(s)

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