Share Email Print

Proceedings Paper

Comparison Of Wavelengths To The Primary Standard At The French National Institute Of Metrology
Author(s): P. Bouchareine; A. Janest
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We describe some properties of the two beam interferometer that we have built at the "Institut National de Metrologie" for wavelength comparison. We describe particularly the phase shifts between visible wave-lengths at zero path difference.

Paper Details

Date Published: 18 April 1978
PDF: 5 pages
Proc. SPIE 0136, 1st European Conf on Optics Applied to Metrology, (18 April 1978); doi: 10.1117/12.956136
Show Author Affiliations
P. Bouchareine, Institut National de Metrologie (France)
A. Janest, Institut National de Metrologie (France)

Published in SPIE Proceedings Vol. 0136:
1st European Conf on Optics Applied to Metrology
Michel H. Grosmann; Patrick Meyrueis, Editor(s)

© SPIE. Terms of Use
Back to Top