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Proceedings Paper

Background Spectral Radiance And Contrast In The 1.5 TO 13 Micrometer Region
Author(s): William A. Dias
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Paper Abstract

Spectral measurement instrumentation for the study of absolute radiance and contrast in the 1.5 to 13 micrometer region has been fabricated. Measurement technology has been developed based on fifteen years of experience. Spectral measurement instrumentation and techniques are discussed, including calibration methods, data acquisition and data reduction. Examples of recent natural background spectra are presented in both absolute and contrast forms.

Paper Details

Date Published: 2 June 1978
PDF: 10 pages
Proc. SPIE 0133, Optics in Missile Engineering, (2 June 1978); doi: 10.1117/12.956069
Show Author Affiliations
William A. Dias, General Dynamics Corporation (United States)

Published in SPIE Proceedings Vol. 0133:
Optics in Missile Engineering
Stephen A. Benton; Geoffery Knight, Editor(s)

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