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Proceedings Paper

LWIR Detector Behavior At Very Low Frequencies
Author(s): D. C. Arrington; W. L. Eisenman
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Paper Abstract

Measurements have recently been made of the signal and noise characteristics of extrinsic photoconductive silicon detectors. The measurements were made at several background levels, bias voltages and detector operating temperatures. Data are shown at modulation frequencies as low as 0.01 Hz, operating temperatures as low as 2.5K and background photon flux densities down to 8 x 107 photons/sec-cm2. Data on the temporal characteristics of the detector signal are presented. In addition, some interesting data on "spontaneous noise spikes" are also shown.

Paper Details

Date Published: 9 November 1977
PDF: 5 pages
Proc. SPIE 0124, Modern Utilization of Infrared Technology III, (9 November 1977); doi: 10.1117/12.955842
Show Author Affiliations
D. C. Arrington, Naval Ocean Systems Center (United States)
W. L. Eisenman, Naval Ocean Systems Center (United States)


Published in SPIE Proceedings Vol. 0124:
Modern Utilization of Infrared Technology III
Irving J. Spiro, Editor(s)

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