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Proceedings Paper

Automatic Cartridge Case Inspection And Process Control Monitor
Author(s): W. J. Coleman; K. L. Swinth
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Paper Abstract

Battelle, Pacific Northwest Laboratories has developed an advanced cartridge case measurement/eject system (CCMES) which automatically inspects and rejects cases at up to 1200 per minute. The system consists of a mechanical handler, measurement instruments, and a dedicated computer. System operation is monitored and controlled while the product is being measured. Five case dimensions are measured by an electro-optical system using diode arrays to measure a case image at unity magnification. By scan averaging, measurement standard deviations as small as 2.5 microns are obtained at a throughput of 1200 cases per minute. Measurements made with the system fall within the uncertainties of hand-gauged values for the same cases. Four zones on each case are examined for surface flaws, such as dents and scratches, by detecting light scattered from the surface. The system can detect these surface flaws at inspection rates of 1200 cases per minute. Using electro-optic methods, two additional measuring stations detect vent hole presence and gross size deviations to prevent mechanical jams. A third station employs an eddy current technique to detect splits and folds in critical regions of the cartridge. The overall system has passed quality assurance tests administered by the sponsor and will soon be installed at the Lake City Army Ammunition Plant.

Paper Details

Date Published: 20 October 1977
PDF: 12 pages
Proc. SPIE 0122, Advances in Laser Engineering I, (20 October 1977); doi: 10.1117/12.955779
Show Author Affiliations
W. J. Coleman, Battelle, Pacific Northwest Laboratories (United States)
K. L. Swinth, Battelle, Pacific Northwest Laboratories (United States)


Published in SPIE Proceedings Vol. 0122:
Advances in Laser Engineering I
Malcolm L. Stitch; Eric J. Woodbury, Editor(s)

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