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Proceedings Paper

An Automated Visual Edge Match System For Image Quality Assessment
Author(s): Jack D. Finley
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Paper Abstract

This paper describes a system which automatically matches scene edges to a physical matrix of test edges for the purpose of estimating image quality. The system developed by EIKONIX is based upon the Itek Visual Edge Match (VEM) Station, highly modified to provide the automatic function. Random edge location and identification is performed by the operator. Scanning is accomplished by means of a one-dimensional self-scanned photodiode array coupled to the microscope by an anamorphic optical system. The data is processed internally by means of a unique eigenvector approach which yields an interesting and sensitive quality discriminator. Calibration is automatic, the machine being operated under computer control in one of several modes. Training time is minimal, and the design of the densitometric system is such that many of the common error sources and limits on dynamic range are avoided. The paper includes system design and analytical considerations as well as experimental data.

Paper Details

Date Published: 22 November 1977
PDF: 13 pages
Proc. SPIE 0117, Data Extraction and Classification from Film, (22 November 1977); doi: 10.1117/12.955659
Show Author Affiliations
Jack D. Finley, ElKONIX Corporation (United States)


Published in SPIE Proceedings Vol. 0117:
Data Extraction and Classification from Film
Robert D. Leighty, Editor(s)

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