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Proceedings Paper

Measurement Of The Effects Of Particulate Contamination On X-Ray Reflectivity
Author(s): P. Slane; E. R. McLaughlin; D. A. Schwartz; L. P. Van Speybroeck; J. W. Bilbro; B. H. Nerren
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Paper Abstract

Because particles of sizes larger than a few tenths microns adversely affect hight resolution X-ray telescopes by scattering and absorbing X-rays, we are investigating the clean-liness required to maintain the ~1% overall calibration precision desired for the Advanced X-ray Astrophysics Facility (AXAF). At the grazing angles used for the AXAF mirrors, each particle shadows a surface area ~ 102 times its geometric area, necessitating glass occlusion specifications much more stringent than typically stipulated for visible-light particulate contamination. On test fiats coated with gold, we have deposited controlled levels of contamination spanning the range from 5 x 10-5 to 5 x 10-3 fractional area covered and have measured the absorption component of extinction over a range of grazing angles and X-ray energies to verify the predicted effects of particulate contamination. Further tests are planned to examine a wider range of energies and to take into account sample flatness and distortions introduced by holding fixtures.

Paper Details

Date Published: 11 October 1989
PDF: 9 pages
Proc. SPIE 1113, Reflective Optics II, (11 October 1989); doi: 10.1117/12.955568
Show Author Affiliations
P. Slane, Harvard-Smithsonian Center for Astrophysics (United States)
E. R. McLaughlin, Harvard-Smithsonian Center for Astrophysics (United States)
D. A. Schwartz, Harvard-Smithsonian Center for Astrophysics (United States)
L. P. Van Speybroeck, Harvard-Smithsonian Center for Astrophysics (United States)
J. W. Bilbro, George C. Marshall Space Flight Center (United States)
B. H. Nerren, George C. Marshall Space Flight Center (United States)


Published in SPIE Proceedings Vol. 1113:
Reflective Optics II
Dietrich G. Korsch, Editor(s)

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