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Proceedings Paper

Studies Of Polish Layers On Infrared Window Materials By Ellipsometry
Author(s): D. K. Burge; P. A. Temple
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Paper Abstract

Ellipsometric measurements at 5461 Å on etched and mechanically polished samples of KC1 are reported. The results show that (1) etched KC1 has a refractive index nearly equal to the bulk value (1.49); (2) polished KC1 samples have a damaged surface layer with indices of 1.42 to 1.45, but there is an ambiguity in the thickness of this layer; and (3) the difference in refractive index between the bulk and surface values has a positive correlation with the increase in total absorption at 10.6 μm measured for the sample. Preliminary measurements on polished CaF2 are also given.

Paper Details

Date Published: 19 October 1977
PDF: 5 pages
Proc. SPIE 0112, Optical Polarimetry: Instrumentation and Applications, (19 October 1977); doi: 10.1117/12.955548
Show Author Affiliations
D. K. Burge, Michelson Laboratories (United States)
P. A. Temple, Michelson Laboratories (United States)

Published in SPIE Proceedings Vol. 0112:
Optical Polarimetry: Instrumentation and Applications
Rasheed M. A. Azzam; David Coffeen, Editor(s)

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