Share Email Print
cover

Proceedings Paper

Ellipsometry Of Electrochemical Surface Layers
Author(s): Rolf H. Muller
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The measurement of changes in the state of polarization of light due to reflection provides an unusually sensitive tool for observing surface layers in any optically transparent environment. A fast, self-compensating ellipsometer has been used to observe the electro-chemical formation of reacted surface layers. The optical effect of mass-transport boundary layers and component imperfections have been taken into account in the interpretation of results.

Paper Details

Date Published: 19 October 1977
PDF: 6 pages
Proc. SPIE 0112, Optical Polarimetry: Instrumentation and Applications, (19 October 1977); doi: 10.1117/12.955544
Show Author Affiliations
Rolf H. Muller, University of California (United States)


Published in SPIE Proceedings Vol. 0112:
Optical Polarimetry: Instrumentation and Applications
Rasheed M. A. Azzam; David Coffeen, Editor(s)

© SPIE. Terms of Use
Back to Top