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Proceedings Paper

Ellipsometry Of Electrochemical Surface Layers
Author(s): Rolf H. Muller
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Paper Abstract

The measurement of changes in the state of polarization of light due to reflection provides an unusually sensitive tool for observing surface layers in any optically transparent environment. A fast, self-compensating ellipsometer has been used to observe the electro-chemical formation of reacted surface layers. The optical effect of mass-transport boundary layers and component imperfections have been taken into account in the interpretation of results.

Paper Details

Date Published: 19 October 1977
PDF: 6 pages
Proc. SPIE 0112, Optical Polarimetry: Instrumentation and Applications, (19 October 1977); doi: 10.1117/12.955544
Show Author Affiliations
Rolf H. Muller, University of California (United States)


Published in SPIE Proceedings Vol. 0112:
Optical Polarimetry: Instrumentation and Applications
Rasheed M. A. Azzam; David Coffeen, Editor(s)

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