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Proceedings Paper

X-Ray Quantum Efficiency Of Microchannel Plates
Author(s): Paul J. Bjorkholm; Leon P. Van Speybroeck; Michael Hecht
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Paper Abstract

The quantum efficiency of microchannel plates has been measured at energies from 0.28 to 3.0 keV and at angles less than 6°. The quantum efficiency reaches a maximum of 27% at 3° and an energy of 0.86 keV. At all energies, the quantum efficiency increases as the angle of incidence decreases until a critical angle is reached, after which the efficiency decreases rapidly. The quantum efficiency, outside of the small angle dip, decreases with energy at a constant angle. The general behaviour of the quantum efficiency can be understood using a very simple physical model. The low angle dip is caused by reflection from the surface of the channel. The variation of the quantum efficiency as a function of energy can be explained by the variation of the X-ray absorption and of the photo- and Auger electron ranges. The data are reasonably reproduced by a simple model.

Paper Details

Date Published: 29 August 1977
PDF: 7 pages
Proc. SPIE 0106, X-Ray Imaging, (29 August 1977); doi: 10.1117/12.955471
Show Author Affiliations
Paul J. Bjorkholm, Stanford University (United States)
Leon P. Van Speybroeck, Stanford University (United States)
Michael Hecht, Stanford University (United States)


Published in SPIE Proceedings Vol. 0106:
X-Ray Imaging
Richard P. Chase; Glenn W. Kuswa, Editor(s)

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