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Proceedings Paper

A Three Component Method Of Data Analysis For Nondestructive Testing By Infrared Scanning
Author(s): M. C. K. Yang; C. K. Hsieh
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Paper Abstract

The infrared scanning data for nondestructive testing are decomposed into three components; global trend, local contours, and noise. Methods are proposed to determine the trend function resulting from surface curvature and surface emissivity changes. The contour function is shown to possess isotherm features which permit the use of pattern recognition to detect structure defects. Data discrimination methods are also presented to identify data as to its implications. As a demonstration for application, two case studies are presented that include analysis for data without either contour or trend component.

Paper Details

Date Published: 15 November 1976
PDF: 5 pages
Proc. SPIE 0095, Modern Utilization of Infrared Technology II, (15 November 1976); doi: 10.1117/12.955176
Show Author Affiliations
M. C. K. Yang, University of Florida (United States)
C. K. Hsieh, University of Florida (United States)

Published in SPIE Proceedings Vol. 0095:
Modern Utilization of Infrared Technology II
Irving J. Spiro, Editor(s)

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