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Proceedings Paper

CCD Image Simulation
Author(s): H. J. Schraibman; J. D. Joseph; J. R. Parsons
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Paper Abstract

Charge Coupled Device (CCD) imaging and processing arrays have shown promise in applications requiring integrated focal plane data processing such as found in certain "smart" sensor and data rate compression designs. This paper presents the results of a computer simulation effort to determine CCD imaging properties in both scanning and area array configurations. The ability to simulate imagery for a variety of array parameters is useful in the design of such imager/processor systems. Results of the study illustrate effects which are both general characteristics of sampled systems and peculiarities of CCDs. Included are resolution loss using computer generated targets, spurious signals due to the relative position of target and sample points, distortions due to linear and sinusoidal smear, effects of target contrast and CCD noise sources. Both tri-bar and highly over-sampled imagery are used in the demonstractions.

Paper Details

Date Published: 15 November 1976
PDF: 8 pages
Proc. SPIE 0095, Modern Utilization of Infrared Technology II, (15 November 1976); doi: 10.1117/12.955173
Show Author Affiliations
H. J. Schraibman, The Aerospace Corporation (United States)
J. D. Joseph, The Aerospace Corporation (United States)
J. R. Parsons, The Aerospace Corporation (United States)

Published in SPIE Proceedings Vol. 0095:
Modern Utilization of Infrared Technology II
Irving J. Spiro, Editor(s)

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