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Proceedings Paper

Remote Profilemetry
Author(s): H. John Caulfield
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Paper Abstract

A new kind of illumination method converts a streak camera into a remote profilemeter. The object is illuminated by a short pulse (thickness cΔt). The backscattered radiation is focussed to form an ordinary image. A slit in that image plane confines our attention to a line across the scene. The slit is imaged onto the photocathode of a streak camera. The streaked record is the depth profile along the line of the slit. Depth resolution is about cΔt/2 (around a millimeter for conveniently available components). With a slight modification we obtain an absolute range finder for each point in the scene with the absolute range accuracy still about cΔt/2. Another modification minimizes the effects of trigger jitter and limited time-bandwidth product of the streak camera. Several applications are noted.

Paper Details

Date Published: 18 January 1977
PDF: 6 pages
Proc. SPIE 0094, High Speed Optical Techniques: Developments and Applications, (18 January 1977); doi: 10.1117/12.955133
Show Author Affiliations
H. John Caulfield, Block Engineering, Inc. (United States)


Published in SPIE Proceedings Vol. 0094:
High Speed Optical Techniques: Developments and Applications
Michel A. Duguay; Richard K. Petersen, Editor(s)

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